Topological Image Texture Analysis for Quality Assessment

Asaad, A. and Rashid, Rasber D. and Jassim, Sabah A. (2017) Topological Image Texture Analysis for Quality Assessment. In: SPIE Commercial and Scientific Sensing and Imaging, 9-13 April 2017, Anaheim, California, United States.

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Image quality is a major factor influencing pattern recognition accuracy and help detect image tampering for forensics. We are concerned with investigating topological image texture analysis techniques to assess different type of degradation. We use Local Binary Pattern (LBP) as a texture feature descriptor. For any image construct simplicial complexes for selected groups of uniform LBP bins and calculate persistent homology invariants (e.g. number of connected components). We investigated image quality discriminating characteristics of these simplicial complexes by computing these models for a large dataset of face images that are affected by the presence of shadows as a result of variation in illumination conditions. Our tests demonstrate that for specific uniform LBP patterns, the number of connected component not only distinguish between different levels of shadow effects but also help detect the infected regions as well.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: Image Quality, Local Binary Pattern, Simplicial complexes
Subjects: Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Divisions: School of Computing
Depositing User: Rachel Pollard
Date Deposited: 21 Aug 2019 11:45
Last Modified: 12 Mar 2020 15:12

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